A Built-in-Self-Test Scheme for Segmented and Binary Weighted DACs

@article{Rafeeque2004ABS,
  title={A Built-in-Self-Test Scheme for Segmented and Binary Weighted DACs},
  author={Sunil Rafeeque and Vinita Vasudevan},
  journal={J. Electronic Testing},
  year={2004},
  volume={20},
  pages={623-638}
}