A Behavior-Level Fault Model for the Closed-Loop Operational Amplifier

@article{Chang2000ABF,
  title={A Behavior-Level Fault Model for the Closed-Loop Operational Amplifier},
  author={Yeong-Jar Chang and Chung-Len Lee and Jwu E. Chen and Chauchin Su},
  journal={J. Inf. Sci. Eng.},
  year={2000},
  volume={16},
  pages={751-766}
}
In this paper, a simple behavior-level fault model, which is able to represent the faulty behavior of the closed-loop operational amplifier (OP), is presented. The fault model, derived from the macro equivalent circuit of the OP but verified with transistor level simulation, consists of the offset fault and the limited-current fault. It can represent the faulty behavior of the closed loop OP of all the transistor parametric (soft) faults and many of the catastrophic (hard) faults. Due to its… CONTINUE READING
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