A Bayesian method for classification of images from electron micrographs.

@article{Sams2002ABM,
  title={A Bayesian method for classification of images from electron micrographs.},
  author={Montserrat Sams{\'o} and Michael J. Palumbo and Michael J. Radermacher and Jun S. Liu and Charles E. Lawrence},
  journal={Journal of structural biology},
  year={2002},
  volume={138 3},
  pages={
          157-70
        }
}
Particle classification is an important component of multivariate statistical analysis methods that has been used extensively to extract information from electron micrographs of single particles. Here we describe a new Bayesian Gibbs sampling algorithm for the classification of such images. This algorithm, which is applied after dimension reduction by correspondence analysis or by principal components analysis, dynamically learns the parameters of the multivariate Gaussian distributions that… CONTINUE READING
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