A Bayesian View on Cryo-EM Structure Determination

Abstract

Three-dimensional (3D) structure determination by single-particle analysis of cryo-electron microscopy (cryo-EM) images requires many parameters to be determined from extremely noisy data. This makes the method prone to overfitting, that is, when structures describe noise rather than signal, in particular near their resolution limit where noise levels are… (More)
DOI: 10.1016/j.jmb.2011.11.010

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