A Bare-chip Probe for High I/O, High Speed Testing

@inproceedings{Lee1994ABP,
  title={A Bare-chip Probe for High I/O, High Speed Testing},
  author={Ken Chi Lik Lee and Hanns Obermaier},
  year={1994}
}
The fixture consists of a four metal layer membrane probe which is an enhancement to a previously described burn-in fixture with a novel alignment scheme and no-wipe contacting buttons. The probe is electrically connected to the DUT pcb with an array of button connections, and board I/O is through coaxial cables to the tester. A mechanical structure provides alignment of the pcb, button connector, and membrane probe while providing controlled pressure between the membrane and die, and at the… CONTINUE READING

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