A Background Sample-Time Error Calibration Technique Using Random Data for Wide-Band High-Resolution Time-Interleaved ADCs

@article{Haftbaradaran2008ABS,
  title={A Background Sample-Time Error Calibration Technique Using Random Data for Wide-Band High-Resolution Time-Interleaved ADCs},
  author={Afshin Haftbaradaran and Kenneth W. Martin},
  journal={IEEE Transactions on Circuits and Systems II: Express Briefs},
  year={2008},
  volume={55},
  pages={234-238}
}
Sample-time error among the channels of a time-interleaved analog-to-digital converter (ADC) is the main reason for significant degradation of the effective resolution of the high-speed time-interleaved ADC. A calibration technique for sample-time mismatches has been proposed and implemented at a low level of complexity. The calibration method uses random data and is especially suitable for ADCs used in digital data communication systems. An 800-MS/s four-channel, time-interleaved ADC system… CONTINUE READING
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A 1-GS/s 11-b timeinterleaved ADC in 0.13- m CMOS

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