A BIST scheme based on self-nonself discrimination of immune system


Built-in self-test (BIST) techniques are rapidly becoming an industry-wide standard test technique in the design of testing support hardware for VLSI circuits. In the BIST setup both test pattern generation and output response analysis are performed on-chip hardware. In this manuscript a BIST scheme based on immune system is presented. The main conceptual ingredient utilized in order to build the proposed scheme is the application of the negative-selection mechanism of the immune system, which is able to discriminate between the self (body's own cell) and any foreign cell (non-self). Experimental results concerning fault detection in some ISCAS85 benchmarks circuits are presented

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@article{Souza2004ABS, title={A BIST scheme based on self-nonself discrimination of immune system}, author={C. P. de Souza and R.C.S. Freire and F. M. de Assis}, journal={Proceedings of the 2004 14th IEEE Signal Processing Society Workshop Machine Learning for Signal Processing, 2004.}, year={2004}, pages={765-774} }