A BIST Scheme With the Ability of Diagnostic Data Compression for RAMs

@article{Hou2014ABS,
  title={A BIST Scheme With the Ability of Diagnostic Data Compression for RAMs},
  author={Chih-Sheng Hou and Jin-Fu Li and Ting-Jun Fu},
  journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems},
  year={2014},
  volume={33},
  pages={2020-2024}
}
This paper proposes a built-in self-test (BIST) scheme with syndrome-compression ability for random access memories (RAMs) with static (SF) and dynamic faults (DFs). A March-element-based (MEB) compression scheme is proposed to reduce the volume of diagnostic data. The MEB compression scheme can efficiently compress the diagnostic data of a RAM tested by a March test for detecting SFs and DFs. Simulation results show that the compression ratio (the ratio of the number bits of the compressed… CONTINUE READING
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