A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques

This paper proposes a new solution for the diagnosis of faults into embedded RAMs, currently under evaluation within STMicroelectronics. The proposed scheme uses dedicated circuitry embedded in a BIST wrapper, and an ATE test program to schedule the data extraction flow and to analyze the gathered information. Testing is performed exploiting a standard IEEE… CONTINUE READING