A 60 dB SNDR 35 MS/s SAR ADC With Comparator-Noise-Based Stochastic Residue Estimation

@article{Verbruggen2015A6D,
  title={A 60 dB SNDR 35 MS/s SAR ADC With Comparator-Noise-Based Stochastic Residue Estimation},
  author={Bob Verbruggen and Jorgo Tsouhlarakis and Takaya Yamamoto and Masao Iriguchi and Ewout Martens and Jan Craninckx},
  journal={IEEE Journal of Solid-State Circuits},
  year={2015},
  volume={50},
  pages={2002-2011}
}
We present a SAR ADC with comparator-noise-based stochastic residue estimation. The circuit uses a 9 cycle SAR converter to generate a residue, which is then quantized by clocking 16 noisy comparators four times each and digitally calculating the most likely input voltage for the obtained distribution of zeros and ones. The ADC achieves a 60.9 dB SNDR for a near-Nyquist input at 35 MS/s for a purely dynamic power consumption of 12 μW/MHz. 

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