A 4Gbps 0.57pJ/bit Process-Voltage-Temperature Variation Tolerant All-Digital True Random Number Generator in 45nm CMOS

@article{Srinivasan2009A40,
  title={A 4Gbps 0.57pJ/bit Process-Voltage-Temperature Variation Tolerant All-Digital True Random Number Generator in 45nm CMOS},
  author={Suresh Srinivasan and Sanu K. Mathew and Vasantha Erraguntla and Ram Krishnamurthy},
  journal={2009 22nd International Conference on VLSI Design},
  year={2009},
  pages={301-306}
}
This paper describes an all-digital on-die true random number generator implemented in 45nm CMOS technology, with random bit throughput of 4Gbps and total energy consumption of 0.57pJ/bit. A 2-step tuning mechanism enables robust operation in the presence of up to 20% fabrication-time process variation as well as immunity to run-time voltage and temperature… CONTINUE READING