A 10 V Josephson Voltage Standard Comparison Between NIST and INMETRO as a Link to BIPM

@article{Landim2010A1V,
  title={A 10 V Josephson Voltage Standard Comparison Between NIST and INMETRO as a Link to BIPM},
  author={Regis Pinheiro Landim and Yi-Hua Tang and Edson Afonso and Vitor Ferreira},
  journal={IEEE Transactions on Instrumentation and Measurement},
  year={2010},
  volume={60},
  pages={2353-2358}
}
This paper describes a 10 V Josephson Voltage Standard (JVS) direct comparison between the National Institute of Standards and Technology (NIST) and the Instituto Nacional de Metrologia, Normalização e Qualidade Industrial (INMETRO) using automatic data acquisition. The results were in agreement to within 1.1 nV and the mean difference between the two JVSs at 10 V is 0.54 nV with a pooled combined standard uncertainty of 1.48 nV. Considering a recent JVS comparison between NIST and the Bureau… CONTINUE READING

From This Paper

Figures, tables, and topics from this paper.
4 Citations
8 References
Similar Papers

References

Publications referenced by this paper.
Showing 1-8 of 8 references

Comparison of the Josephson Voltage Standards of NIST and the BIPM (BIPM.EM-K10.b.)

  • S. Solve, R. Chayramy, M. Stock, Y. Tang, J. E. Sims
  • Technical Supplement of Metrologia, 46, 01010…
  • 2009
Highly Influential
9 Excerpts

Improvement of Inmetro Josephson Voltage Standard

  • R. P. Landim, E. Afonso, V. Ferreira
  • Submitted to CPEM
  • 2010
1 Excerpt

Comparison of the Josephson Voltage Standards of the Inmetro and the BIPM

  • D. Reymann, S. Solve, E. Afonso, V. Ferreira, R. P Landim
  • Rapport BIPM-2006/06,
  • 2006
1 Excerpt

A 10 V Josephson voltage standard comparison between NIST and INMETRO as a link to BIPM

  • Y. Tang, E. Afonso, V. Ferreira
  • Proc . Dig . CPEM

An application of the guide to measurement uncertainty , ” in

  • C. Hamilton
  • Proc . Meas . Sci . Conf .

Comparison of the INMETRO and NIST Josephson voltage standards ( SIM . EM . BIPM - K 10 . b 1 )

  • E. Afonso, V. Ferreira

Similar Papers

Loading similar papers…