• Published 2009

3-D Shape Measurement Method with Modulated Slit Light Robust for Interreflection and Subsurface Scattering

@inproceedings{Furuse20093DSM,
  title={3-D Shape Measurement Method with Modulated Slit Light Robust for Interreflection and Subsurface Scattering},
  author={Tatsuhiko Furuse and Shinsaku},
  year={2009}
}
We propose a method to accurately measure the shape of objects by suppressing the effect of indirect reflection caused by the interreflection and subsurface scattering. We use a M-sequence pattern shifted along the line of the slit light, and the sequence of captured images is analyzed using synchronous demodulator. This method utilizes two properties of indirect reflection; one is the transfer characteristics of higher spatial frequency components, and the other is geometric constraint between… CONTINUE READING