2D reaction-diffusion computation of charge trapping evolution in dielectric materials submitted to an electron beam irradiation

Abstract

In this work, we present a new two-dimensional mathematical modeling in a cylindrical coordinate system which computes the time evolution of trapped charges in Al<sub>2</sub>O<sub>3</sub>/SiO<sub>2</sub> material due to irradiation by primary electrons. A reaction-diffusion equation expressing the spatial distribution of free charges fluxes in the material… (More)

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Cite this paper

@article{Aoufi20122DRC, title={2D reaction-diffusion computation of charge trapping evolution in dielectric materials submitted to an electron beam irradiation}, author={A. Aoufi and G. Damamme}, journal={2012 25th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV)}, year={2012}, pages={396-397} }