250-MHz advanced test systems

Abstract

New generations of electronic chips bring with them the promise of more capacity, storage, and speed. They also bring new challenges to design, test and manufacturing. A look at a series of advanced test systems, how they were designed and why, sheds new light on this practical side of advanced technology. These test systems are the ATS series from IBM… (More)

12 Figures and Tables

Topics

  • Presentations referencing similar topics