1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations

@article{Tsai20081DbasedDD,
  title={1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations},
  author={Du-ming Tsai and Su-Ta Chuang},
  journal={Machine Vision and Applications},
  year={2008},
  volume={20},
  pages={423-434}
}
Thin film transistor-liquid crystal display (TFT-LCD) is a major technology for flat panel display used in a wide range of electronic devices. As the TFT-LCD panel becomes dense, small defects can only be observed at an extremely high resolution. For fast imaging of a large-sized TFT-LCD panel at a high resolution, a one-dimensional (1D) line scan system is… CONTINUE READING