1/f Noise and G-r noise related to reliability in optoelectronic coupled devices

Abstract

The reliability of Optocoupler devices is important since they provide an isolation from over-stress environmental conditions. In this paper, the electric ageing and Co-60 irradiation tests are performed on commercial optocouplers, and I-V characteristics and low-frequency noise are measured before and after the tests. It is found that the 1/f noise and g-r… (More)

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