0.2 V 8T SRAM with improved bitline sensing using column-based data randomization

Abstract

8T SRAMs operating at sub-threshold supply voltages suffer from bit-line swing degradation when the data pattern of a column is dominated by `1' or `0'. Worst case scenarios happen when the accessed bit is different from the rest of the column. In this work, a simplified Linear Feedback Shift Register (LFSR) is used to shuffle input data so that… (More)
DOI: 10.1109/ASSCC.2014.7008880

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