Corpus ID: 109874923

동작 온도에 따른 sub - micron MTJ의 자화 반전 특성에 관한 연구

@inproceedings{2005,
  title={동작 온도에 따른 sub - micron MTJ의 자화 반전 특성에 관한 연구},
  author={김기원 and 황인준 and 조영진 and 김태완},
  year={2005}
}
3 Citations
Characteristics of the Al/sub 2/O/sub 3/ barrier with CoFeB pinned layer in magnetic tunnel junctions
Amorphous FM electrode, CoFeB, was used in MTJs to improve the property of the insulating layer interface. The tunnel junctions with a structure of Ta(50 nm)/NiFe(8 nm)/IrMn(10 nm)/pinned layer(4Expand