"Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction.

@article{Kirkland2004IndirectHT,
  title={"Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction.},
  author={Angus I. Kirkland and R{\"u}diger R Meyer},
  journal={Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada},
  year={2004},
  volume={10 4},
  pages={
          401-13
        }
}
Improvements in instrumentation and image processing techniques mean that methods involving reconstruction of focal or beam-tilt series of images are now realizing the promise they have long offered. This indirect approach recovers both the phase and the modulus of the specimen exit plane wave function and can extend the interpretable resolution. However, such reconstructions require the a posteriori determination of the objective lens aberrations, including the actual beam tilt, defocus, and… CONTINUE READING
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