"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC

@article{Kerzerho2006AnalogueNO,
  title={"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC},
  author={Vincent Kerzerho and Philippe Cauvet and Serge Bernard and Florence Aza{\"i}s and Mariane Comte and Michel Renovell},
  journal={Eleventh IEEE European Test Symposium (ETS'06)},
  year={2006},
  pages={159-164}
}
In this paper, complex mixed signal circuits such as SiP or SOC including several ADCs and DACs are considered. A new DFT technique is proposed allowing the test of this complete set of embedded ADCs and DACs in a fully digital way such that only a simple low cost tester can be used. Moreover, this technique called "analogue network of converters" (ANC) requires an extremely simple additional circuitry and interconnect 

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