• Corpus ID: 34379694

" An Efficient Self-Test Structure for Sequential Machines

@inproceedings{Darst2006AE,
  title={" An Efficient Self-Test Structure for Sequential Machines},
  author={Charles R. Darst and M. Melgara and M. Paolini-CSELT and H. P. Chang and William A. Rogers and J. A. Abraham-Univ. and S. Morpurgo and C. Segre-Olivetti},
  year={2006}
}
1.1 1:30 p.m. "An Efficient Self-Test Structure for Sequential Machines" S.Z. Hassan Rolm Mil-Spec Computers In this paper, a BIST structure for sequential machines is presented. The approach requires augmentation of the machine by the addition of an extra input and some logic. The test sequence is independent of the function implemented and depends only on the number of input combinations and the number of states. The approach lends itself to being automated as part of a design synthesis…