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  • Fang Yi, Zhuxin Li, Yi Su
  • 2009
In order to solve the problem of defect criterion that can not effectively identify the Stress concentration region and crack defect, wavelet packet transformation was used to multiscale wavelet analysis of Metal Magnetic Memory (MMM) signals. A new signal inspection technology was presented based on energy increment feature and wavelet packet frequency(More)
Metal magnetic memory (MMM) signals can reflect stress concentration and cracks on the surface of ferromagnetic components, but the traditional criteria used to distinguish the locations of these stress concentrations and cracks are not sufficiently accurate. In this study, 22 indices were extracted from the original MMM signals, and the diagnosis results(More)
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