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Accurate measurement of residual stress is necessary to obtain reliable predictions of fatigue lifetime and enable estimation of time-to-facture for any given stress level. In this article,… (More)
Abstract In this study X-ray diffraction was used to measure the redistribution of residual stress in carburized and heat treated AISI 8620 steel specimens of different sizes during successive… (More)
Abstract The stability of RE 5 (Si x Ge 1− x ) 3 plates was studied through electron microscopy examination of as-cast and annealed Gd 5 Ge 4 single crystal samples. Thermal annealing of samples at… (More)
Abstract Optical and electron micrographs reveal that R 5 (Si x Ge 1– x ) 3 -type compounds, existing as thin plates, are prevalent in R 5 (Si x ,Ge 1– x ) 4 compound systems. The purpose of this… (More)