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A new machine learning method—Wavelet neutral network was introduced and some of its characteristics were discussed.  Rough set and WNN are combined to establish a rough set-based data pre-processing wavelet network model. It effectively overcome the wavelet network does not distinguish importance of property of samples and slow defect(More)
In construction cost forecasting system, a great many uncertain factors effect the cost decision-making, so it is difficult to do effective forecasting by using traditional methods such as time series approach, regression analysis. In this paper, a nonlinear model based on RBF Neural Network is presented. There are some ameliorated measures in leaning(More)
A probing technique to obtain the energy distribution of positive charges in high-k gate stack dielectrics, both within and beyond the substrate bandgap, has been proposed. The energy distribution of different high-k devices has been investigated and attention has been paid to their differences from the single-lay-ered SiON devices. The results obtained(More)
Hot carrier injection (HCI) is one of the critical de-vice degradation mechanisms, and is conventionally characterized with constant voltage stress (CVS) method. A novel voltage-step stress (VSS) methodology is pro-posed to quickly characterize HCI degradation, based on a simplified reaction-diffusion model. This wafer-level reliability qualification(More)
When nanometer-sized devices are subjected to identical stresses, their degradation has a statistical spread, resulting in a time-dependent device-to-device variation (TDDV). The variation has two sources: charging fluctuation for a given number and location of defects and a variation in defect numbers and locations for different devices. The existing(More)