Zeng-Lei Liu

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This paper researched the electric field induced fabrication with atomic force microscope (AFM). Current-induced deposition rather than voltage-induced deposition is introduced. With this method, nano dots, lines and pits can be fabricated. Especially, the nano lines can be deposited continuously, rather than depositing a row of nano dots to form a nano(More)
This paper introduces a novel AFM deposition method. In contrast to traditional method, the method in this paper has two differences. Firstly in our method AFM works in contact mode. AFM tip presses on substrate slightly in contact mode and it does not need to control AFM tip-substrate separation precisely, which makes AFM deposition easy to carry out.(More)
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