Zahari Mohamed Darus

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Technical Program Committee Former Sites and Chairs of the GLS-VLSI High Performance Options through Nanoelectronics MEMs PASTA: Partial Scan to Enhance Test Compaction p. 4 On Applying Set Covering Models to Test Set Compaction p. 8 On Test Generation with a Limited Number of Tests p. 12 Functional ATPG for Delay Faults p. 16 On Path Delay Fault Testing of(More)
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