Z. Prijić

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Negative bias temperature instabilities in commercial IRF9520 p-channel power VDMOSFETs under both static and pulsed bias stress conditions were studied. The pulsed voltage stressing caused generally lower shifts as compared to static stressing performed at the same temperature with equal stress voltage magnitude, as a consequence of partial recovery during(More)
The electrical resistivity (&#x03C1;) of Yb doped BaTiO<inf>3</inf> ceramics in function of temperature is investigated in this article. The concentrations of additive in the BaTiO<inf>3</inf> doped samples were ranged from 0.01 to 1.0 at % Yb. The conventional solid state reaction is used for preparation of initial samples. The samples are sintered at(More)
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