Yves Le Traon

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Today's smartphones are a ubiquitous source of private and confidential data. At the same time, smartphone users are plagued by carelessly programmed apps that leak important data by accident, and by malicious apps that exploit their given privileges to copy such data intentionally. While existing static taint-analysis approaches have the potential of(More)
<i>Shake Them All</i> is a popular "Wallpaper" application exceeding millions of downloads on Google Play. At installation, this application is given permission to (1) access the Internet (for updating wallpapers) and (2) use the device microphone (to change background following noise changes). With these permissions, the application could silently record(More)
Many threats present in smartphones are the result of interactions between application components, not just artifacts of single components. However, current techniques for identifying inter-application communication are ad hoc and do not scale to large numbers of applications. In this paper, we reduce the discovery of inter-component communication (ICC) in(More)
Use cases are believed to be a good basis for system testing. Yet, to automate the test generation process, there is a large gap to bridge between high-level use cases and concrete test cases. We propose a new approach for automating the generation of system test scenarios in the context of object-oriented embedded software, taking into account traceability(More)
Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability across their features. This leads to combinatorial explosion of the number of derivable products. Exhaustive testing in such a large space of products is infeasible. One possible option is to test SPLs by generating test cases that cover all possible T feature(More)
The need for testing-for-diagnosis strategies has been identified for a long time, but the explicit link from testing to diagnosis (fault localization) is rare. Analyzing the type of information needed for efficient fault localization, we identify the attribute (called Dynamic Basic Block) that restricts the accuracy of a diagnosis algorithm. Based on this(More)
Large Software Product Lines (SPLs) are common in industry, thus introducing the need of practical solutions to test them. To this end, t-wise can help to drastically reduce the number of product configurations to test. Current t-wise approaches for SPLs are restricted to small values of t. In addition, these techniques fail at providing means to finely(More)
Aspect-oriented programming introduces new challenges for software testing. Inparticular the pointcut descriptor (PCD) requires particular attention fromtesters. The PCD describes the set of joinpoints where the advices are woven.In this paper we present a tool, AjMutator, for the mutation analysis of PCDs.AjMutator implements several mutation operators(More)