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Projections of global mean temperature changes (ΔT) in the future are associated with intrinsic uncertainties. Much climate policy discourse has been guided by "current knowledge" of the ΔTs uncertainty, ignoring the likely future reductions of the uncertainty, because a mechanism for predicting these reductions is lacking. By using simulations of Global(More)
Keyword: Machine Learning (ML), Data mining (DM), discrete process, virtual metrology (VM) I. INTRODUCTION-Semiconductor manufacturing is characterized by a sequence of sophisticated manufacturing processes, often exceeding several hundred production steps. Such processes possess both aspects of continuous and discrete operations. In this paper, we suggest(More)
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