Yukinori Nakajima

Learn More
CONCLUSION GJB2 mutations are responsible not only for deafness but also for the occurrence of vestibular dysfunction. However, vestibular dysfunction tends to be unilateral and less severe in comparison with that of bilateral deafness. OBJECTIVES The correlation between the cochlear and vestibular end-organs suggests that some children with congenital(More)
CONCLUSIONS Our study revealed that VEMPs in responses to clicks and 500 Hz STB were abnormal in 25% of athletes with congenital profound sensorineural hearing loss for the Deaf Olympic Games. These results confirm that a part of deaf athletes with congenital vestibular failure is well compensated for higher level sport activities. OBJECTIVES The aim of(More)
For the validation of snow/ice products of the Advanced Earth Observing Satellite-II/Global Imager (ADEOS-II/GLI), several field campaigns were performed for various types of snow conditions with the Moderate Resolution Imaging Spectroradiometer (MODIS) and GLI overpasses at four sites in Alaska and eastern Hokkaido, Japan from 2001 to 2005. The target(More)
The directional emissivity of snow and ice surfaces in the 8–14 Am thermal infrared (TIR) atmospheric window was determined from spectral radiances obtained by field measurements using a portable Fourier transform infrared spectrometer in conjunction with snow pit work. The dependence of the directional emissivity on the surface snow type (grain size and(More)
This study compared vestibular and dynamic visual acuity in 19 adult athletes with deafness participating in Deaflympics to those of 25 young adults with normal hearing. Balance capability was evaluated using a one-leg standing test with eyes open and stabilometry. Caloric tests and vestibular evoked myogenic potential tests were conducted to test(More)
We propose a testable design method of level shifters inside a liquid crystal display driver IC. The design method enables us to detect open defects in level shifters by supply current testing that are difficult to be tested by voltage testing. Also, we show by circuit simulation that more resistive open defects may be detected by supply current testing(More)
  • 1