Yuichi Hamamura

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We propose a general method for repair-yield estimation based on critical area analysis using a commercial Monte-Carlo simulator. We classify failures into several types according to the repair rules and use iterative critical area analysis for each type of failure (ICAA-ETF) to calculate the repair yield. Our proposed method makes it possible to accurately(More)
SUl\l~IARY Repairing embedded memories (e-memories) on an advanced system-on-chip (SOC) product is a key technique used to improve product yield. However. increasing the die area of SOC products equipped with various types of e-memories on the die is an issue. A fuse scheme can be used to resolve this issue. However. several fuse schemes that have been(More)
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