Yong Jun Park

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We demonstrate a wideband circular polarization reflector fabricated as cascades of helical films with different pitch thickness by using glancing angle deposition (GLAD) technique. The full-width-at-half-maximum bandwidth of this reflector is measured from the reflectance spectra and is found about 200 nm indicating the feasibility of wideband reflector. A(More)
In this paper, we report a linear polarization-discriminatory state inverter made of three-layer sculpture thin film fabricated by oblique angle deposition technique. The first and third layers are quarter-wave plates of zigzag structure and the middle of them is a circular Bragg reflector of left-handed helical structure. It is found that the normal(More)
Single phase nanoparticles (NPs) of CeO2, Ce0.5Zr0.5O2, Ce0.5Hf0.5O2 and Ce0.5Hf0.25Zr0.25O2 were successfully synthesized by co-precipitation method at constant pH and temperature. The X-ray diffraction results revealed that the additive atoms did not segregate to form secondary phases but led to grain size variation in the NPs. The 10 Dq values in the(More)
We report an atomic layer deposition chamber for in-situ synchrotron X-ray scattering study of thin film growth. The chamber was designed for combined synchrotron X-ray reflectivity and two-dimensional grazing-incidence X-ray diffraction measurement to do a in-situ monitoring of ALD growth. We demonstrate ruthenium thermal ALD growth for the performance of(More)
Wafer-scale arrays of well-ordered Pb(Zr(0.2)Ti(0.8))O3 nanodiscs and nanorings were fabricated on the entire area (10 mm x 10 mm) of the SrRuO3 bottom electrode on an SrTiO3 single-crystal substrate using the laser interference lithography (LIL) process combined with pulsed laser deposition. The shape and size of the nanostructures were controlled by the(More)
Evolution of complex ferroelastic domain structures of PbTiO<sub>3</sub> nano-islands grown epitaxially on Pt(001)/MgO(001) single crystal substrate by chemical solution deposition has been investigated by two-dimensional reciprocal space mapping technique using synchrotron X-ray diffraction. With decreasing lateral size and thickness of the nano-islands,(More)
TiO2 thin film prepared by the atomic layer deposition (ALD) with supplies of Ti(O-i-Pr)4 and H2O have been analyzed using the difference X-ray reflectivity (DXRR). The thickness of buried interfacial layer (IL) embedded in between Si-substrate and TiO2 layer was characterized as a function of temperatures of 20, 300, and 500 degrees C mounted on an in-situ(More)
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