Yin S. Ng

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The increasing demand for electrical failure analysis (EFA) in yield enhancement [1] has created new challenges for foundries and their clients. Dynamic EFA techniques, more in demand with the smaller technology nodes, have largely been the domain of the design-house failure analysis (FA) lab. In 2010 on 40nm packaged parts, a new laser-based technology,(More)
A new Jitter Mitigation feature in the latest generation laser voltage probing (LVP) tool effectively removes PLL jitter from LVP waveforms [Ng Yin S, Lo W, Wilsher K. Next generation laser voltage probing. In: Proceeding, international symposium on testing and failure analysis; 2008. p. 249]. It facilitates the probing of phase-locked loop (PLL) driven(More)
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