Yik Yee Tan

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The performance of scanning electron microscope can be defined in terms of parameters such as the spatial resolution, and the signal to noise ratio of the image. Knowledge of these quantities is important in verifying that an instrument meets its specification, and subsequently for tracking and optimizing its performance during use. Analytical methods based(More)
This paper describes the finite element simulation for diffusion controlled intermetallic formation of Au/Al interface during the wire bonding process. The analogous correlation between the intermetallic atomic diffusion and the heat transport is introduced, and the simulation of intermetallic diffusion using a commercial finite element method (FEM) tool(More)
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