Yik Yee Tan

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A proposal to assess the quality of scanning electron microscope images using mixed Lagrange time delay estimation technique is presented. With optimal scanning electron microscope scan rate information, online images can be quantified and improved. The online quality assessment technique is embedded onto a scanning electron microscope frame grabber card(More)
This paper describes the finite element simulation for diffusion controlled intermetallic formation of Au/Al interface during the wire bonding process. The analogous correlation between the intermetallic atomic diffusion and the heat transport is introduced, and the simulation of intermetallic diffusion using a commercial finite element method (FEM) tool(More)
An exponential contrast stretching (ECS) technique is developed to reduce the charging effects on scanning electron microscope images. Compared to some of the conventional histogram equalization methods, such as bi-histogram equalization and recursive mean-separate histogram equalization, the proposed ECS method yields better image compensation. Diode(More)
The performance of scanning electron microscope can be defined in terms of parameters such as the spatial resolution, and the signal to noise ratio of the image. Knowledge of these quantities is important in verifying that an instrument meets its specification, and subsequently for tracking and optimizing its performance during use. Analytical methods based(More)
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