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Robustness of Sub-22nm multigate devices against physical variability

• Alexandra L. Zimpeck, Ygor Aguiar, Cristina Meinhardt, Ricardo Augusto da Luz Reis
• 2017 IEEE International Symposium on Circuits and…
• 2017

This work provides a detailed set of predictive data about FinFET and Trigate devices behavior considering process variability effects in ON and OFF currents. These evaluations help to understand the… (More)

Geometric variability impact on 7nm Trigate combinational cells

• Alexandra L. Zimpeck, Ygor Aguiar, Cristina Meinhardt, Ricardo Augusto da Luz Reis
• 2016 IEEE International Conference on Electronics…
• 2016

Multigate devices are the main candidates to replace planar devices in the sub 10nm technologies. Besides all advantages, unfortunately, these processes bring additional variability sources due to… (More)

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