Formation of the Giant Planets by Concurrent Accretion of Solids and Gas
- J. Pollack, O. Hubickyj, P. Bodenheimer, J. Lissauer, M. Podolak, Y. Greenzweig
- Physics, Geology
- 1 June 1995
New numerical simulations of the formation of the giant of the second phase. planets are presented, in which for the first time both the gas and The actual rates at which the giant planets accreted…
Accretion rates of protoplanets: II. Gaussian distributions of planetesimal velocities
- Y. Greenzweig, J. Lissauer
- Physics, Geology
- 1 June 1991
Accretion rates of protoplanets
- Y. Greenzweig, J. Lissauer
- Geology, Physics
- 1 September 1990
Nebular Gas Drag and Planetary Accretion
- D. Kary, J. Lissauer, Y. Greenzweig
- Physics, Geology
- 1 November 1993
Abstract We have studied the orbital dynamics of planetesimals whose decay due to gas drag in the primordial solar nebula causes them to spiral sunward and approach a growing planet. The planet is…
Subsurface damage from helium ions as a function of dose, beam energy, and dose rate
- R. Livengood, Shida Tan, Y. Greenzweig, J. Notte, S. McVey
- Physics, Medicine
- 14 December 2009
In recent years, helium ion microscopy has produced high resolution images with novel contrast mechanisms. However, when using any charged particle beam, one must consider the potential for sample…
Structural characterization of He ion microscope platinum deposition and sub-surface silicon damage
- Y. Drezner, Y. Greenzweig, R. Livengood
- Physics
- 2 July 2012
In this paper we studied helium ion beam induced deposition (HIBID) of Pt on a silicon wafer using the recently commercialized helium ion microscope (HIM) at 25 kV and low beam currents. The…
Accretion of Mass and Spin Angular Momentum by a Planet on an Eccentric Orbit
- J. Lissauer, A. Berman, Y. Greenzweig, D. Kary
- Physics, Geology
- 1 May 1997
Abstract We have extended our previous calculations of planetary accretion rates (Y. Greenzweig and J. J. Lissauer 1990,Icarus87, 40–77, and 1992,Icarus100, 440–463) to the case of a planet on an…
Simulating advanced focused ion beam nanomachining: a quantitative comparison of simulation and experimental results
- K. Mahady, Shida Tan, Y. Greenzweig, Amir Raveh, P. Rack
- PhysicsNanotechnology
- 14 September 2018
This comparison is the most extensive validation of the EnvizION simulation against experiments to date, and the location of implanted ions in simulations is shallower than experiments, which is attributed to the fact that implanted species are required to find nearest neighbor vacancies and not allowed to occupy interstitial positions.
Probe current distribution characterization technique for focused ion beam
- Shida Tan, R. Livengood, Y. Greenzweig, Y. Drezner, D. Shima
- Physics
- 26 November 2012
Focused ion beam technology continues to scale into the nano regime to keep pace with the scaling of semiconductor processes and biological science research. As the requirements for higher image…
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