Xiaoqing Wen

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Research on low-power scan testing has been focused on the shift mode, with little or no consideration given to the capture mode power. However, high switching activity when capturing a test response can cause excessive IR drop, resulting in significant yield loss. This paper addresses this problem with a novel low-capture-power X-filling method by(More)
The tutorial will present ForSyDe as the theoretical framework for system specification. Then, HetSC, a SystemC specification methodology and associated library for heterogeneous, system specification and design will be described. SystemC AMS will be proposed for mixed analogue-digital modelling. Finally, the tutorial will address system modeling using TLM.(More)
This work proposes a new per-test fault diagnosis method based on the X-fault model. The X-fault model represents all possible behaviors of a physical defect or defects in a gate and/or on its fanout branches by using different X symbols on the fanout branches. A novel technique is proposed for analyzing the relation between observed and simulated responses(More)
High-quality at-speed scan testing, characterized by high small-delay-defect detecting capability, is indispensable to achieve high delay test quality for DSM circuits. However, such testing is susceptible to yield loss due to excessive power supply noise caused by high launch-induced switching activity. This paper addresses this serious problem with a(More)
X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effectiveness of previous X-filling methods suffers from lack of guidance in selecting targets and values for X-filling. This paper addresses this problem with a highly-guided X-filling(More)
Defects not described by conventional fault models are a challenge for state-of-the-art fault diagnosis techniques. The X-fault model has been introduced recently as a modeling technique for complex defect mechanisms. We analyze the performance of the X-fault diagnosis for a number of defect classes leading to highly complex circuit behavior on electrical(More)
Test data modification based on test relaxation and X-filling is the preferable approach for reducing excessive IR-drop in at-speed scan testing to avoid test-induced yield loss. However, none of the existing test relaxation methods can control the distribution of identified don't care bits (X-bits), thus adversely affecting the effectiveness of IR-drop(More)