Xiaofei Feng

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Synchrotron radiation real-time imaging technology was conducted to in situ observe the interfacial reaction in line-type Cu/Sn-9Zn/Ni interconnect under a current density of 2.0 &#x00D7; 10<sup>4</sup> A/cm<sup>2</sup> at 230 &#x00B0;C. The reverse polarity effect in Cu/Sn-9Zn/Ni interconnects undergoing L-S EM was verified by the continuous growth of the(More)
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