Woon-Hak Lee

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Insight is given on improved behaviors of the programmed NiSi polygated electrical fuse (eFuse) during the high temperature storage (HTS) test. By using a noble transmission electron microscopy (TEM) that includes scanning transmission electron microscopy (STEM), energy dispersive x-ray spectrometry (EDS), electron energy loss spectrometry (EELS) and(More)
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