Wing-Kei S. Yu

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Large register files are common in highly multi-threaded architectures such as GPUs. This paper presents a hybrid memory design that tightly integrates embedded DRAM into SRAM cells with a main application to reducing area and power consumption of multi-threaded register files. In the hybrid memory, each SRAM cell is augmented with multiple DRAM cells so(More)
We present a non-volatile processor architecture where its entire state can be almost instantly stored and restored in a non-volatile fashion. This capability is attractive for embedded or mobile devices in highly energy constrained environments. The non-volatile microprocessor can enable long computations to continue across power interruptions on(More)
We demonstrate that unmodified commercial Flash memory can provide two important security functions: true random number generation and digital fingerprinting. Taking advantage of random telegraph noise (a type of quantum noise source in highly scaled Flash memory cells) enables high quality true random number generation at a rate up to 10Kbits / second. A(More)
We evaluate seven techniques for extracting unique signatures from NAND flash devices based on observable effects of process variation. Four of the techniques yield usable signatures that represent different trade-offs between speed, robustness, randomness, and wear imposed on the flash device. We describe how to use the signatures to prevent counterfeiting(More)
This paper introduces a novel information hiding technique for Flash memory. The method hides data within an analog characteristic of Flash, the program time of individual bits. Because the technique uses analog behaviors, normal Flash memory operations are not affected and hidden information is invisible in the data stored in the memory. Even if an(More)
This paper provides detailed characterizations of physical sources behind Flash memory based Physical Unclonable Functions (FPUFs). Universal process variations in Flash physical systems are identified and decomposed into layout, intrinsic, stress and bit-wise fluctuation sources. The study shows the understanding of systematic variations and noise sources(More)
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