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In the past decade there has been a high degree of interest in improving the quality, productivity, and reliability of manufactured products. Global competition and higher customer expectations for safe, reliable products are driving this interest. After the areas of experimental design and statistical process control the one of reliability is the next to… (More)

- William Q. Meeker
- Technometrics
- 2003

A solution to get the problem off, have you found it? Really? What kind of solution do you resolve the problem? From what sources? Well, there are so many questions that we utter every day. No matter how you will get the solution, it will mean better. You can take the reference from some books. And the recurrent events data analysis for product repairs… (More)

Engineers in the manufacturing industries have used accelerated test (AT) experiments for many decades. The purpose of AT experiments is to acquire reliability information quickly. Test units of a material, component, subsystem, or entire systems are subjected to higher-than-usual levels of one or more accelerating variables such as temperature or stress.… (More)

- L. A. Escobar, William Q. Meeker
- Biometrics
- 1992

In this paper we show how to evaluate the effect that perturbations to the model, data, or case weights have on maximum likelihood estimates from censored survival data. The ideas and methods also apply to other nonlinear estimation problems. We review the ideas behind using log-likelihood displacement and local influence methods. We describe new… (More)

This paper describes Bayesian methods for life test planning with Type II censored data from a Weibull distribution, when the Weibull shape parameter is given. We use conjugate prior distributions and criteria based on estimating a quantile of interest of the lifetime distribution. One criterion is based on a precision factor for a credibility interval for… (More)

The fatigue-limit model studied here contains an unknown fatigue limit parameter. Under this model, specimens tested below this fatigue-limit level of stress will never fail. The model also allows the standard deviation of fatigue life to be a function of stress. Researchers can use this model to describe the standard deviation and stress dependence in… (More)

- Yao Zhang, William Q. Meeker
- Technometrics
- 2006

- Huaiqing Wu, William Q. Meeker
- Technometrics
- 2002

Most companies maintain warranty databases for purposes of financial reporting and warranty expense forecasting. In some cases, there are attempts to extract engineering information (e.g., on the reliability of components) from such databases. Another important application is to use warranty data to detect potentially serious field reliability problems as… (More)

- Francis G. Pascual, William Q. Meeker
- Technometrics
- 1999

In a fatigue-limit model, units tested below the fatigue limit (also known as the threshold stress) theoretically will never fail. This article uses a random fatigue-limit model to describe (a) the dependence of fatigue life on the stress level, (b) the variation in fatigue life, and (c) the unit-to-unit variation in the fatigue limit. We t the model to… (More)

High reliability systems generally require individual system components having extremely high reliability over long periods of time. Short product development times require reliability tests to be conducted with severe time constraints. Frequently few or no failures occur during such tests, even with acceleration. Thus, it is difficult to assess reliability… (More)