William Q. Meeker

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A solution to get the problem off, have you found it? Really? What kind of solution do you resolve the problem? From what sources? Well, there are so many questions that we utter every day. No matter how you will get the solution, it will mean better. You can take the reference from some books. And the recurrent events data analysis for product repairs(More)
Engineers in the manufacturing industries have used accelerated test (AT) experiments for many decades. The purpose of AT experiments is to acquire reliability information quickly. Test units of a material, component, subsystem, or entire systems are subjected to higher-than-usual levels of one or more accelerating variables such as temperature or stress.(More)
In this paper we show how to evaluate the effect that perturbations to the model, data, or case weights have on maximum likelihood estimates from censored survival data. The ideas and methods also apply to other nonlinear estimation problems. We review the ideas behind using log-likelihood displacement and local influence methods. We describe new(More)
This paper describes Bayesian methods for life test planning with Type II censored data from a Weibull distribution, when the Weibull shape parameter is given. We use conjugate prior distributions and criteria based on estimating a quantile of interest of the lifetime distribution. One criterion is based on a precision factor for a credibility interval for(More)
The fatigue-limit model studied here contains an unknown fatigue limit parameter. Under this model, specimens tested below this fatigue-limit level of stress will never fail. The model also allows the standard deviation of fatigue life to be a function of stress. Researchers can use this model to describe the standard deviation and stress dependence in(More)
Most companies maintain warranty databases for purposes of financial reporting and warranty expense forecasting. In some cases, there are attempts to extract engineering information (e.g., on the reliability of components) from such databases. Another important application is to use warranty data to detect potentially serious field reliability problems as(More)
In a fatigue-limit model, units tested below the fatigue limit (also known as the threshold stress) theoretically will never fail. This article uses a random fatigue-limit model to describe (a) the dependence of fatigue life on the stress level, (b) the variation in fatigue life, and (c) the unit-to-unit variation in the fatigue limit. We t the model to(More)