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— The quality of formal specifications and the circuits they are written for can be evaluated through checks such as vacuity and coverage. Both checks involve mutations to the specification or the circuit implementation. In this context, we study and prove properties of mutations to finite-state systems. Since faults can be viewed as mutations, our theory(More)
We address the problem of verifying Probabilistic Computation Tree Logic (PCTL) properties of Markov Decision Processes (MDPs) whose state transition probabilities are only known to lie within uncertainty sets. We first introduce the model of Convex-MDPs (CMDPs), i.e., MDPs with convex uncertainty sets. CMDPs generalize Interval-MDPs (IMDPs) by allowing(More)
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— We propose a methodology to determine the occurrence of falls from among other common human movements. The source data is collected by wearable and mobile platforms based on three-axis accelerometers to measure subject kinematics. Our signal processing consists of preprocessing, pattern recognition and classification. One problem with data acquisition is(More)
Effective system verification requires good specifications. The lack of sufficient specifications can lead to misses of critical bugs, design re-spins, and time-to-market slips. In this paper, we present a new technique for mining temporal specifications from simulation or execution traces of a digital hardware design. Given an execution trace, we mine(More)
Systems are increasingly being constructed from off-the-shelf components acquired through a globally distributed, untrusted supply chain. The lack of trust in these components necessitates additional validation of the components before use. Additionally, hardware trojans are becoming a pressing concern. In this paper, we present a novel formalism and method(More)
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardening have been proposed to synthesize circuits that are tolerant to soft errors. However, each such technique has associated overheads of power, area, and performance. In this paper,(More)