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A substrate noise analysis methodology is described that simulates substrate noise waveforms at sensitive locations of large-scale mixed-signal ICs. Simulation results for a 7.3mm x 7.3mm chip with 500k devices obtained in a few hours on an engineering server show good correlation with silicon measurements as testing conditions are varied. An analysis of(More)
A series of high-quality La2−xSrxCuO4 (LSCO) superconductor crystals in the under-doping region with x = 0.063, 0.07, 0.09, 0.10, 0.111 and 0.125 has been successfully prepared by traveling-solvent floating-zone (TSFZ) technique. The crystals are large and free of sub-grains and foreign phases. The high crystal quality has been revealed by double-crystal(More)
We present angular-dependent current-voltage (I-V) measurements in borocarbide YNi(2)B(2)C single crystals near the vortex-glass irreversible line. External magnetic fields are applied along the angle θ with respect to the c-axis. The nonlinear I-V curves reveal scaling behaviour near the transition. Using the scaling analysis, the relevant critical(More)
Scientific efforts are growing to understand artificial BiFeO3/SrRuO3/SrTiO3-heterostructures, wherein an altered environment at each interface, caused by epitaxial strains, broken symmetry, off-stoichiometry and charge transfer, can generate a rich spectrum of exotic properties. Herein, (BiPb)FeO3/SrRuO3/SrTiO3-heterostructures were sputtered with various(More)
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