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This paper describes a semi-automated process, framework and tools for harvesting, assessing, improving and maintaining high-quality linked-data. The framework, known as DaCura 1 , provides dataset curators, who may not be knowledge engineers, with tools to collect and curate evolving linked data datasets that maintain quality over time. The framework(More)
We study and present design guidelines for thru-reflect-line vector-network-analyzer calibration kits used for characterizing circuits and transistors fabricated on silicon integrated circuits at millimeter-wave frequencies. We compare contact-pad designs and develop fixed-fill contacts that achieve both repeatable and low contact-pad capacitances. We(More)
OWL (Web Ontology Language) reasoning has been extensively studied since its standardization by W3C. While the prevailing research in the OWL reasoning community has targeted faster, larger scale and more expressive OWL reasoners, only a small body of research is focused on OWL reasoning for resource-constrained devices such as mobile phones or sensors.(More)
Centralized semantic sensor network systems gradually show performance degradation as the scale of the sensor network increases. Thus systems based on distributed approaches with local, autonomous management features are urgently required. In order to achieve local autonomy, it is necessary to push semantics towards the edge of the sensor network, but this(More)
— Modern smart buildings utilize sensor networks for facilities management applications such as energy monitoring. However as buildings become progressively more embedded with sensor networks, the challenge of managing and maintaining the sensor networks themselves becomes ever more significant. As a cost-sensitive activity, facilities management(More)
Increasingly there is a demand for more scalable fault management schemes to cope with the ever increasing growth and complexity of modern networks. Current distributed fault correlation schemes typically adopt rigid topologies, which require great effort in topology configuration. In this paper, we introduce a distributed fault correlation scheme which(More)
This paper compares on-wafer thru-reflect-line (TRL) and off-wafer short-open-load-thru (SOLT) and line-reflect-reflect-match (LRRM) vector-network-analyzer probe-tip calibrations for amplifier characterization and parasitic-extraction calibrations for transistor characterization on silicon integrated circuits at millimeter-wave frequencies. We show that(More)