Wei - Hsiu Huang

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A failure analysis of a product due to the on chip ESD structure defects is presented in this paper. ESD is one of the most important reliability issues in the design of integrated circuits. About 40% of the failure of integrated circuits is related to ESD/EOS stress. In order to improve the reliability of ICs, the design of ESD protection is increasingly(More)
Artificial Immune System is adopted as a Heuristic Algorithm to solve the combinatorial problems for decades. Nevertheless, many of these applications took advantage of the benefit for applications but seldom proposed approaches for enhancing the efficiency. In this paper, we continue the previous research to develop a Self-evolving Artificial Immune System(More)
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