Wei-Ching Tham

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In this paper we discuss the characteristics of pipeline features, e.g. welds, cracks and erosion objects, and present a method for the diagnostically lossless compression of Transverse Field Inspection (TFI) data, a new type of pipeline inspection data in contrast to the traditional Magnetic Flux Leakage (MFL) inspection data.
Collector-Emitter breakdown voltage failure of IGBT can be caused by leakage characteristic or solely reverse blocking voltage issue. The involvement of potential defect could be located near the front side, where the main transistor construction located (the top side), chip temination edge and down to the backside where the fieldstop layer takes place.(More)
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