Warawoot Thowladda

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This paper presents a computer application of the surface roughness measurement of highly smooth surfaces. The Phase Shifting Interferometry technique which is a non-contact technique is applied for the roughness measurement. Our optic-based measurement system utilizes a 0.5 mW He-Ne laser source with the wavelength of 632.8 nm. Fringes from the measurement(More)
A comparison of the properties for two ITO thin films was performed. The two films were as follows – as-deposited and annealed ITO films. The influence of annealing on the structural, morphological, electrical, and optical properties was studied. The post-annealing treatment was done at a temperature of 400 for 1 h in air. The ITO thin films were deposited(More)
CuBO<sub>2</sub> is prepared by a solid-state reaction method to investigate thermoelectric properties in high temperature. The XRD result confirms the CuBO<sub>2</sub> compound existing in this method. The Seebeck reveals the compound displays p-type thermoelectric material. The experimental results of electrical resistivity exhibited results of 0.004 S/cm(More)
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