Wang Langfeng

  • Citations Per Year
Learn More
This paper advances an electrostatic discharge displacement current (ESDDC) which will "flow" through the space to all the victim devices on the EUT when discharge occurs and the ESDDC contributes to the failure of the equipment besides the discharge current and the electromagnetic field radiated from the ESD. Experiments were performed to test the ESDDC.(More)
Circuit model of ESD test circumstance is established. By inverse Laplace transform, analytical expression of current is got. Then we obtain simulation of current rise time (t<sub>r</sub>) under different combination of circuit parameters. A few fitted polynomials that describe the relationship of t<sub>r</sub> to these parameters are got, whose accuracy is(More)
Electronic devices are getting more and more sensitive to the electro-static discharge (ESD) because of their smaller size and higher frequency. An electronic dictionary device studied here has failed in the ESD immunity test according to the IEC61000-4-2 standard. Many factors which could impact on the ESD immunity performance of the device are(More)
In this paper, the transmission line theory was used to analyze the electrostatic discharge (ESD) transient process. Finite-difference time-domain (FDTD) method is used to simulate the discharge current being prescribed in the IEC 61000-4-2. The factors influencing the current parameters were examined, the suggestion for designing ESD generator was put(More)
This paper present development rule of high-tech industry on the view of relationship of innovation feature factors and profit with statistics data from National Bureau of Statistics by Dual-density Dependent model and Density Dependence Model. It was found that the R&#x00026;D investment did not generate direct promotion for profit growth, new products(More)
  • 1