Walid S. El-Deeb

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An effective multiport measurement system for the characterization of N -port nonlinear microwave devices is proposed. The proposed measurement system has the capability of measuring the S-parameters of linear microwave circuits and the amplitude-modulation-to-amplitude-modulation (AM/AM) and amplitude-modulation-to-phase-modulation (AM/PM) conversions for(More)
This paper presents a dynamic AM-AM and AM-PM characterization of multiport RF power amplifiers. These measurements have been enabled by the multiport MTA-based measurement setup proposed in this paper. The setup provides simple, accurate, and time saving mechanism for these kinds of dynamic distortion characterizations since it is able to perform the(More)
A measurement system capable of relative waveform measurement and on-wafer power de-embedding is presented in this paper. A comprehensive description and calibration mechanism of the developed measurement system is reported. The calibration methodology has been implemented on a two-port Microwave Transition Analyzer (MTA) but is readily applicable to(More)
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