Walid S. El-Deeb

Learn More
A measurement system capable of relative waveform measurement and on-wafer power de-embedding is presented in this paper. A comprehensive description and calibration mechanism of the developed measurement system is reported. The calibration methodology has been implemented on a two-port Microwave Transition Analyzer (MTA) but is readily applicable to(More)
This paper presents a dynamic AM-AM and AM-PM characterization of multiport RF power amplifiers. These measurements have been enabled by the multiport MTA-based measurement setup proposed in this paper. The setup provides simple, accurate, and time saving mechanism for these kinds of dynamic distortion characterizations since it is able to perform the(More)
  • 1